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  1. Newsgroups: can.vlsi
  2. Path: sparky!uunet!utcsri!skule.ecf!torn!news.ccs.queensu.ca!venus!venus!janet
  3. From: janet@venus.ic.cmc.ca (Janet Tite)
  4. Subject: MTB:  BNR's DFT Tools
  5. Message-ID: <1992Nov12.132827.12103@venus.ic.cmc.ca>
  6. Sender: usenet@venus.ic.cmc.ca (News Administrator)
  7. Nntp-Posting-Host: venus
  8. Organization: Canadian Microelectronics Corporation
  9. Distribution: can
  10. Date: Thu, 12 Nov 1992 13:28:27 GMT
  11. Lines: 75
  12.  
  13. ------------------------------------------------------------------------------
  14. CANADIAN MICROELECTRONICS CORPORATION/SOCIETE CANADIENNE DE MICRO-ELECTRONIQUE
  15. ------------------------------------------------------------------------------
  16.  
  17.                 **** MICROELECTRONICS TECHNOLOGY BULLETIN ****
  18.                                                              November 11, 1992
  19.  
  20.  
  21. Technology:         BNR's DFT Tools
  22. Developed By:       Northern Telecom
  23. Release Date:       November 10, 1992
  24. ID Code:            SE0158
  25. Status:             Supported
  26.  
  27. Description:        The BNR  Scan  Design approach for the purpose of automatic
  28.                     generation of test  that  guarantees  high structural fault
  29.                     coverage.  The test  generated  by the Scan Software checks
  30.                     each element in the circuit  to  verify  that  the  element
  31.                     operates correctly.  
  32.  
  33.                     Key points:
  34.                     -   Storage elements  can be tested by  shifting  a  simple
  35.                         pattern through the Scan chain and observing.
  36.  
  37.                     -   Test    vectors   for  combinational  circuits  can  be
  38.                         generated automatically,  and combinational logic tests
  39.                         can be applied  by  shifting  inputs and outputs in and
  40.                         out of the Scan chain.
  41.  
  42. Keywords:           Scanchek,  Automatic Test Pattern Generation (ATPG),
  43.                     Sequence, High Structural Fault Coverage, Scan Chain
  44.  
  45. Known Problems and Limitations:
  46. Suggested Enhancements:
  47. Notes:
  48.  
  49. Release Category:   Category 1 - University Members:    Available to CMC member
  50.                     universities    for   scholarship,  research  and  teaching
  51.                     purposes  for  the  sole  intent of designing  IC's.    The
  52.                     foregoing  is  subsequent  to  the  following  distribution
  53.                     restrictions being  met.   
  54.  
  55.                     Category    2  -  External  Licensees:    Available  (on  a
  56.                     case-by-case basis subject to CMC obtaining BNR's approval)
  57.                     to CMC non-member universities and non-profit institutions,
  58.                     including those located outside  of  Canada.   The licensed
  59.                     materials may only be used  for  scholarship,  research and
  60.                     teaching purposes for the sole intent  of  designing  IC's.
  61.                     The  foregoing is subsequent to the following  distribution
  62.                     restrictions  being  met.       
  63.  
  64. Distribution  Requirements:
  65.                     Release  Category  1 - Member Universities:  Duly  executed
  66.                     Equipment Loan  Agreement and appropriate Schedule thereto.
  67.  
  68.                     Release Category 2 - External Licensees:  Subsequent to CMC
  69.                     obtaining BNR's approval, the  External Licensee must enter
  70.                     into a BNR Tools Licensed Materials Use Agreement with CMC.
  71.  
  72. To request this technology send a request for distribution via AIM to:
  73.    
  74.                             vlsiic@cmc.ca
  75.                            VLSIIC@QUCDNCMC
  76.  
  77. -------------------------------------------------------------------------------
  78. MICROELECTRONICS TECHNOLOGY  BULLETINS describe available technology  that can
  79. be sourced  through Canadian Microelectronics Corporation,  its Members or its
  80. suppliers.   Examples include design cells, CAD software, technical reports or
  81. fabrication technology.   The bulletin  provides  basic information about  the
  82. status of  the technology  and  conditions  of  access.   For more information
  83. contact:       Doug Cashman             Network:    cashman@cmc.ca
  84.                                         Facsimile:  (613) 548-8104
  85. ------------------------------------------------------------------------------
  86. CANADIAN MICROELECTRONICS CORPORATION/SOCIETE CANADIENNE DE MICRO-ELECTRONIQUE
  87. ------------------------------------------------------------------------------
  88.