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- From: vinoski@ch.apollo.hp.com (Stephen Vinoski)
- Newsgroups: comp.lsi.testing
- Subject: Re: Boundary Scan JTAG 1149.1 Experience?
- Summary: lighten up, Arnie
- Message-ID: <BxH4w7.ts@scd.hp.com>
- Date: 10 Nov 92 00:19:18 GMT
- References: <lfatgtINNj5@news.bbn.com> <BxD9CM.C1@scd.hp.com> <12860@sail.LABS.TEK.COM>
- Sender: news@scd.hp.com (News Account)
- Organization: Hewlett-Packard Corporation, Chelmsford, MA
- Lines: 45
-
- In article <12860@sail.LABS.TEK.COM> arnief@sail.LABS.TEK.COM (Arnie Frisch) writes:
- >NOW... I WANT TO TAKE EXTREME ISSUE WITH YOUR INFERENCE THAT THE
- >APOLLO 10K ARCHITECTURE FOR SCAN IS SOMEHOW BETTER THAN BOUNDARY SCAN.
- >
- >The P1149.1 standard is the engine that is driving the future of
- >built-in test. Departures from this standard slow the process of
- >progress. The issue is not whether something is better (and I doubt
- >that your example qualifies) but whether the standard is "good
- >enough". If it is good enough, it should be used, and if it is used
- >people will find that it has much more capability than is visible on
- >the surface. For example, did you know that ATT uses boundary scan as
- >the basis for communication of internal BIST results from chips to
- >boundary scan controllers in production test applications? Did you
- >know that this use, and extensions of this methodology, are in
- >development at many major sites in the US and elsewhere?
- >
- >Did you know that a substantial infrastructure - involving HW and SW is
- >being created around P1149.1 and its extensions, an infrastructure that
- >will not support other architectures and scan methodologies? Do you
- >think it is smart and cost effective and productive to depart from the
- >standard under these conditions?
-
- Do you realize that the DN10000 scan architecture was developed before
- 1149.1? How can you accuse us of "departing from the standard" when
- the standard wasn't even around when we did this work?
-
- The DN10k scan architecture and 1149.1 are different beasts. Each has
- its good features and not-so-good features, and each does some things
- better than the other. Having written hundreds of thousands of lines
- of scan software, I personally believe that the DN10k architecture is
- easier for software to deal with when it comes to board-level testing.
- But that is only my opinion, and it could be wrong. But you will
- allow me to have my own opinions, won't you, Arnie? Or is there only
- one standardized opinion, too?
-
- 1149.1 is the best standard we have today, but it is not the be-all
- and end-all of scan test architectures. It is worthwhile for anyone
- involved in scan testing to study the DN10000 scan architecture and
- others so that their good features can be incorporated into the next
- scan test standard. Do you think it is "smart and cost effective and
- productive" to reinvent the wheel?
-
- Chill out, Arnie.
-
- -steve
-