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- Path: sparky!uunet!gatech!hubcap!ncrcae!ncrlnk!ncr-mpd!Don.Allingham
- From: Don.Allingham@FtCollins.NCR.COM (Don Allingham)
- Newsgroups: comp.lsi.testing
- Subject: Re: To Test or Not to Test?
- Message-ID: <DON.ALLINGHAM.92Sep3081939@bbking.FtCollins.NCR.COM>
- Date: 3 Sep 92 07:19:39 GMT
- References: <17lsueINN1js@bashful.crhc.uiuc.edu>
- Sender: uucp@ncr-mpd.FtCollins.NCR.COM
- Reply-To: Don.Allingham@FtCollinsCO.NCR.COM
- Organization: /home/bbking/dona/.organization
- Lines: 67
- In-reply-to: patel@crhc.uiuc.edu's message of 28 Aug 92 18:57:18 GMT
-
- In article <17lsueINN1js@bashful.crhc.uiuc.edu> patel@crhc.uiuc.edu (Janak H. Patel) writes:
-
- > For high yield (very close to 100%) parts, the answer is very clear,
- > "I hardly ever ship a defective part, so why do I need testing?"
- > In reality, this does happen. I know two manufactureres who do not
- > test some chips. These chips are high volume, mature process, and
- > very low cost. Any testing would just increase the cost. (one also
- > told me that testing would increase defects in such a chip!)
-
- I think a lot of this has to do with the part itself. Maybe a cheap $1
- LCD watch that comes from a typical 100% yield process, this would be
- ok. But for an SRAM for a satellite, I would want to make sure I
- completely tested it. Even 100% yield processes have problems.
- Suppliers can ship you bad material. Machines in the fab may glitch.
- There are a lot of variables.
-
- > Then there are chips with low yield, aggressive design and large number of
- > gates, such as microprocessors, where it is very easy to justify
- > testing and testability benefits.
-
- > However, a vast majority of ASIC designs fall between these two
- > extremes. It is here where the situation is very murkey. It is
- > not very easy to sell testability and high coverage to these group.
- > What if you did only a functional test with 60% coverage?
-
- We normally see a trade off. The major concerns are:
-
- 1) Time to market
- 2) Quality
- 3) Cost
-
- Pick any two :-) Design complexities of ASICs have been skyrocketing in
- the past few years. The many ASICs are starting to become 20k, 30k, and
- even 50k+ gates in size.
-
- > Best case is that,
- > (a) you don't ship very many defective chips. (just lucky!) or,
- > (b) the customers are not very mad at receiving bad chips, or
-
- Boy, would I like to have customers like this :-) I have some land in
- Florida for sale ....
-
- (c) the customers don't know that it is your chip that is bad in the board
- (they may attribute the defect to the board manufacturing process rather
- than to your chip manufaturing process)
-
- But they will eventually find the problem. And when they do, you can be
- guaranteed a very angry customer. If for some reason, they don't find
- the problem, a low yield may make the board unattractive to manufacture,
- and it may be cancelled. The those selling the chips lose, too.
-
- > The "best cases" defined above are far from rare, in fact some
- > tell me that it is the norm in their facility. The "worst cases" are
- > rare at present, but are increasing with the size of the ASICs.
-
- From what I see, the problem is reversed, especially among ASICs. Maybe
- not for DRAMS, SRAMS, or other stable, long term processes. In the ASIC
- market, the processes are always on the leading edge. You have to be,
- or you cannot stay in business. Everyone wants the leading edge process
- because it is denser (cheaper) and faster. New processes are always
- less stable than old, mature processes.
-
- --
- Don Allingham
- NCR Microelectronics Don.Allingham@FtCollins.NCR.com
- Ft. Collins, CO. uunet!ncrlnk!ncr-mpd!Don.Allingham
-
-