NetNews Usenet Archive 1992 #19/NN_1992_19.iso/spool/comp/lsi/testing/214

Internet Message Format | 1992-09-03 | 1.4 KB

Path: sparky!uunet!cs.utexas.edu!devnull!black
From: [e-mail] (David C. Black)
Newsgroups: comp.lsi.testing
Subject: Ring oscillators for characterization?
Summary: Are they a good idea? Over voltage/temperature/process?
Keywords: Ring oscillator, High freq., off-chip measurement
Message-ID: <[e-mail]>
Date: 3 Sep 92 11:28:32 GMT
Sender: [e-mail]
Reply-To: [e-mail] (David C. Black)
Organization: /etc/organization
Lines: 18

In article <[e-mail]> [e-mail]
(Tapas Banerjee) writes:

TAPAS> I was wondering, what kind of problems do you face when you want to
TAPAS> take out couple of tens of MHz freq. out of a chip and what kind of
TAPAS> care is to be taken in measurement of those signals (i.e. the signals
TAPAS> out of chip).

Along a similar line, I am interested in others experience with using
on-chip ring-oscillators to gather characterization data.  Local experiences
suggest these are not very easy to use and perhaps useless.  Does anyone
have data on successes?  We are designing with CMOS .8 - 1 micron gate
arrays and standard cell technologies.
--
| David C. Black                  Electrical Engineer                    |
| Tandem Computers Incorporated   Guardian: SMTPGATE@AUSTIN(black@tzone) |
| 14231 Tandem Blvd.              Internet: [e-mail]         |
|_Austin, Texas 78728-6699________Phone: [phone]__________________|