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- FUNCTIONAL TESTING OF RAM--IMPLEMENTATION OF THE ATS AND
-
- THE ATS+ ALGORITHMS
-
- by
-
- Mohammad Khurrum
- and
- Dean Lance Smith
- Dept. of Electrical Engineering
- Memphis State University
- Memphis, TN 38152
- (901) 678-3253
- (901) 678-2175
-
-
- This program is an implementation of the ATS (Algorithmic Test
- Sequence) algorithm developed by Knaizuk and Hartman and the
- ATS+ algorithm developed by Nair. The program tests RAM for any
- single or multiple stuck-at-0 or stuck-at-1 faults. The inputs
- to the program are the starting and ending addresses of any part
- of the Random Access Memory. The output is the address of the
- location where the fault occurrs and the type of the fault which
- occurrs (stuck-at-0 or stuck-at-1). A message is displayed if
- no stuck-at fault is detected.
-
- Two functions, ats() and atst(), do the actual testing. The
- ats() function has eight steps. These steps write patterns and
- then read them back to check if they were written properly or if
- there were any faults. The atst() function has thirteen steps
- which do the testing and indicate a fault if there is one.
-
- The variables g0, g1, g2, end and start are huge pointers. The
- variables seg1, seg2, off1 and off2 are integers. The RAM is
- divided into three sections represented by g0, g1 and g2. The
- function hex() reads the starting and ending addresses (segment,
- offset) from the keyboard in hexadecimal.
-