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- Path: sparky!uunet!ogicse!news.tek.com!sail!arnief
- From: arnief@sail.LABS.TEK.COM (Arnie Frisch)
- Newsgroups: comp.lsi.testing
- Subject: Re: Boundary Scan JTAG 1149.1 Experience?
- Message-ID: <12867@sail.LABS.TEK.COM>
- Date: 10 Nov 92 16:40:21 GMT
- Article-I.D.: sail.12867
- References: <BxD9CM.C1@scd.hp.com> <12860@sail.LABS.TEK.COM> <BxH4w7.ts@scd.hp.com>
- Organization: Tektronix, Inc., Beaverton, OR.
- Lines: 27
-
- In article <BxH4w7.ts@scd.hp.com> vinoski@ch.apollo.hp.com (Stephen Vinoski) writes:
- >In article <12860@sail.LABS.TEK.COM> arnief@sail.LABS.TEK.COM (Arnie Frisch) writes:
- ...........
- >Do you realize that the DN10000 scan architecture was developed before
- >1149.1? How can you accuse us of "departing from the standard" when
- >the standard wasn't even around when we did this work?
-
- Do you realize that JTAG (the Joint Test Action Group) had been working
- on this for about 8 years, and that they were well ahead of the DN10000
- architecture when they started writing the basis for the P1149.1
- standard?
- ........
- >1149.1 is the best standard we have today, but it is not the be-all
- >and end-all of scan test architectures. It is worthwhile for anyone
- >involved in scan testing to study the DN10000 scan architecture and
- >others so that their good features can be incorporated into the next
- >scan test standard. Do you think it is "smart and cost effective and
- >productive" to reinvent the wheel?
-
- As I understand it, consultants were hired to do the major part of the
- IC design for the 10K - including the scan design. They subsequently
- came out with a product for testing scan designs and tried to sell it -
- unsuccessfully - under the banner "Gillytronics". Seems like something
- was lacking in their methodology.
-
- Arnold Frisch
- Tektronix Laboratories
-