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- Xref: sparky comp.graphics:9576 sci.image.processing:662
- Newsgroups: comp.graphics,sci.image.processing
- Path: sparky!uunet!cs.utexas.edu!csc.ti.com!tilde.csc.ti.com!fstop.csc.ti.com!vidcom!venkat
- From: venkat@vidcom.csc.ti.com (Venkat Venkateswar)
- Subject: Wanted digitized test patterns/charts (IEEE facsimile test chart etc.)
- Message-ID: <1992Sep9.231104.638@csc.ti.com>
- Sender: usenet@csc.ti.com
- Nntp-Posting-Host: vidcom
- Organization: Texas Instruments
- Date: Wed, 9 Sep 1992 23:11:04 GMT
- Lines: 14
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- Folks,
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- I would like to get a hold of digitized test patterns/charts for both
- TV as well as hardcopy applications (eg: the IEEE Facsimile Test Chart).
- Please send me email if you have any that you can share.
- Thanks,
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- Venkat (venkat@csc.ti.com)
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