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- Newsgroups: comp.lsi.testing
- Path: sparky!uunet!usc!sol.ctr.columbia.edu!ira.uka.de!math.fu-berlin.de!unidui!du9ds3!veit
- From: veit@du9ds3.uni-duisburg.de (Holger Veit)
- Subject: Re: Rise and shine
- References: <1992Aug28.143621.1917@mcc.com>
- Date: 31 Aug 92 07:35:06 GMT
- Reply-To: veit@du9ds3.uni-duisburg.de
- Organization: Uni-Duisburg FB9 Datenverarbeitung
- Sender: @unidui.uni-duisburg.de
- Message-ID: <veit.715246506@du9ds3>
- Lines: 66
-
- In <1992Aug28.143621.1917@mcc.com> praveen@sirius.mcc.com (Praveen Vishakantaiah) writes:
-
- >Holger> I cannot imagine that everyone is interested in design
- >Holger> (comp.lang.vhdl, comp.lang.verilog, comp.sys.mentor, comp.lsi*),
- >Holger> but nobody in testing of all the stuff produced.
-
- >Well, isn't testing harder than designing ;-). Nobody has proved VLSI
- >design to be an NP-complete problem (as far as I know)!
-
- >Rise and shine, all you testing folks. Spend some time posting useful
- >discussions pertaining to VLSI testing. Don't work too hard on the testing
- >problem [I hope my advisor does not see this:-)]. After all, the testing
- >problem was NP-complete, is NP-complete and will be NP-complete!!
-
- I don't think that you can rate the design process by the complexity of an
- algorithm, but even for testing, NP-completeness could have been shown for
- combinational deterministic TPG (polynomial transformation to SAT problem)
- only. Sequential TPG has the additional time parameter (this might come close
- to Turing's halting problem). Your opinion is quite correct. Everybody who
- has put together two gates successfully, might be called a "designer"
- (I am really afraid that some of the students which have heard - not learnt -
- design courses here will go to industry and design some microprocessor which
- will control parts of my car :-), just self-criticism, forget it), but
- design verification or testing really requires some skills.
-
- >Harlow> Come on, Janak: you have lots of good things going on at UIUC: how
- >Harlow> about some timely, controversial postings from you and/or your
- >Harlow> group?
-
- >Although this is a very good and useful suggestion, it is very unlikely
- >that researchers are ready to discuss their ideas openly due to competitive
- >reasons. But, we can always discuss published work as well as get feedback
- >from people in the industry as to the research direction in testing which
- >would be useful to them.
-
- This is what Nikolaus and I intended when we proposed this group. I would not
- expect that for instance Janak talks about his recent improvement that he
- just put into his software, but if he contributes a paper to some conference,
- and is accepted and the date of the delivery of the final version is over
- (important!), he could talk about it, and may profit from a discussion on it.
-
- >Harlow> Suppose we had a manufacturing line whose yield was 100%...
- >Harlow> would we then not need to test products? .........
- >Harlow> .................
- >Harlow> More generally speaking, how much of what we call testing is
- >Harlow> actually a cover for lack of design verification?
-
- See my reply to the original posting.
-
- >Praveen Vishakantaiah.
-
- >------------------------------------------------------------------------------
- >-- Microelectronics and Computer Technology Corporation, | Ph : (512)338-3736|
- >-- 3500 W. Balcones Center Drive | e-mail : |
- >-- Austin, TX 78759. | praveen@mcc.com |
- >------------------------------------------------------------------------------
- >-- ALSO A HARD WORKING MEMBER OF :-)
- >-- Computer Engineering Research Center, | Ph : (512)471-8013|
- >-- University of Texas, Austin. e-mail : praveen@cerc.utexas.edu |
- >-----------------------------------------------------------------------------
-
- --
- | | / Holger Veit | INTERNET: veit@du9ds3.uni-duisburg.de
- |__| / University of Duisburg | BITNET: veit%du9ds3.uni-duisburg.de@UNIDO
- | | / Dept. of Electr. Eng. | "No, my programs are not BUGGY, these are
- | |/ Inst. f. Dataprocessing | just unexpected FEATURES"
-