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  1. Path: sparky!uunet!cis.ohio-state.edu!zaphod.mps.ohio-state.edu!rpi!uwm.edu!ogicse!pdxgate!donald.ee.pdx.edu!kevins
  2. From: kevins@donald.ee.pdx.edu
  3. Newsgroups: sci.electronics
  4. Subject: PROM durability (ESD-wise)
  5. Message-ID: <6009@pdxgate.UUCP>
  6. Date: 20 Aug 92 05:17:36 GMT
  7. Article-I.D.: pdxgate.6009
  8. Sender: news@pdxgate.UUCP
  9. Reply-To: kevins@donald.ee.pdx.edu ()
  10. Organization: Portland State University
  11. Lines: 13
  12.  
  13. How immune are bipolar PROM's (low density (32x8)) to harsh environments?
  14. Are they as sturdy as general LSTTL?  Any worse than CMOS?  Which pins
  15. are the succeptable ones:  VCC, GND, Addr, Data, OE?
  16.  
  17. All but the address pins are connected to the outside (for insertion into
  18. a connector).  How can I protect the device so that it has better chances
  19. of surviving human (non-grounded) environments?
  20.  
  21. Any and all help will be greatly appreciated.
  22. -=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=
  23. Kevin B. Stanton            Internet: kevins@ee.pdx.edu
  24. Portland State University        Dept. of Electrical Engineering
  25. (503) 725-5422                Box 751, Portland, Oregon  97207
  26.