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- From: ntaib@silver.ucs.indiana.edu (Iskandar Taib)
- Subject: Re: What's the deal? My chip says "SX-25"; Norton says "SX-33"
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- References: <sheldon.725671411@pv141b.vincent.iastate.edu> <1992Dec30.000820.3526@athena.mit.edu> <1992Dec30.192345.7949@mksol.dseg.ti.com>
- Date: Mon, 4 Jan 1993 22:11:37 GMT
- Lines: 26
-
- In article <1992Dec30.192345.7949@mksol.dseg.ti.com> mccall@mksol.dseg.ti.com (fred j mccall 575-3539) writes:
- >In <1992Dec30.000820.3526@athena.mit.edu> jfc@athena.mit.edu (John F Carr) writes:
- >
- >>In article <sheldon.725671411@pv141b.vincent.iastate.edu>
- >> sheldon@iastate.edu (Steve Sheldon) writes:
- >
- >>> But since these are targeted for commercial usage, they're most likely
- >>>only testing 1 in every 100 or so, as Mike said, a few out of each batch.
- >
- >>I thought yields for recent microprocessors were well under 100% (and
- >>probably under 50%). If this is the case, every chip must be tested.
- >
- >I think 30% (or less) is a more realistic yield number.
-
- Perhaps they test a few processors on a wafer? And if the processors
- fail then the whole wafer is thrown out? Makes sense to me.. perhaps
- what causes problems are registration of masks or bad doping, which
- would affect entire wafers, not just one chip on the wafer.
-
-
-
- --
- -------------------------------------------------------------------------------
- Iskandar Taib | The only thing worse than Peach ala
- Internet: NTAIB@SILVER.UCS.INDIANA.EDU | Frog is Frog ala Peach
- Bitnet: NTAIB@IUBACS !
-