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Text File  |  1992-12-29  |  1.1 KB  |  27 lines
  1. Newsgroups: comp.sys.ibm.pc.hardware
  2. Path: sparky!uunet!zaphod.mps.ohio-state.edu!pacific.mps.ohio-state.edu!linac!att!cbnewsc!cbfsb!cbnewsg.cb.att.com!rnichols
  3. From: rnichols@cbnewsg.cb.att.com (robert.k.nichols)
  4. Subject: Re: What's the deal? My chip says "SX-25"; Norton says "SX-33"
  5. Message-ID: <1992Dec30.005517.3154@cbfsb.cb.att.com>
  6. Sender: news@cbfsb.cb.att.com
  7. Organization: AT&T
  8. References: <C01LuI.542@news.cso.uiuc.edu> <sheldon.725671411@pv141b.vincent.iastate.edu> <1992Dec30.000820.3526@athena.mit.edu>
  9. Distribution: na
  10. Date: Wed, 30 Dec 1992 00:55:17 GMT
  11. Lines: 14
  12.  
  13. In article <1992Dec30.000820.3526@athena.mit.edu> jfc@athena.mit.edu (John F Carr) writes:
  14. ...
  15. >I thought yields for recent microprocessors were well under 100% (and
  16. >probably under 50%).  If this is the case, every chip must be tested.
  17. ...
  18.  
  19. Every one gets a 100% *functional* test.  The degree of A.C. parametric
  20. testing and full-speed testing done would be a closely guarded secret,
  21. but is probably a small sample for consumer-market devices from a
  22. mature process line.
  23.  
  24. Bob Nichols
  25. AT&T Bell Laboratories
  26. rnichols@ihlpm.ih.att.com
  27.