home *** CD-ROM | disk | FTP | other *** search
- Xref: sparky sci.electronics:13468 sci.materials:565 sci.physics:11831 sci.engr.chem:389
- Newsgroups: sci.electronics,sci.materials,sci.physics,sci.engr.chem
- Path: sparky!uunet!darwin.sura.net!mips!sdd.hp.com!usc!sol.ctr.columbia.edu!destroyer!wsu-cs!uts.cc.wayne.edu!cms.cc.wayne.edu!MEDELMA
- From: MEDELMA@cms.cc.wayne.edu (Michael Edelman)
- Subject: Re: PZT Excitation
- Message-ID: <168329F9F.MEDELMA@cms.cc.wayne.edu>
- Sender: news@uts.cc.wayne.edu (News)
- Organization: Wayne State University, C&IT
- References: <1992Jul25.222024.7255@homecare.com> <1992Jul27.185909.19949@pbhyg.PacBell.COM> <24938@dog.ee.lbl.gov> <1992Jul28.123849.20613@murdoch.acc.Virginia.EDU>
- Date: Tue, 28 Jul 1992 15:21:01 GMT
- Lines: 26
-
- In article <1992Jul28.123849.20613@murdoch.acc.Virginia.EDU>
- rb9a@kelvin.seas.Virginia.EDU (Raul Baragiola) writes:
-
- > [...]
- >Well, the HEP are neither the first nor the main users of high magnetic
- >fields and magnetic shielding. An important area is electron spectroscopy,
- >widely used for surface analysis, where you want residual fields of
- >milligauss. Look at Sevier's Electron Spectroscopy for a discussion of
- >this. In other applications in atomic or solid state physics
- >people fields of microgauss or smaller.
- > For kGauss fields, it is better to use iron or other materials
- >because Mu-metal saturates.
- >
- I used Mu-Metal some years back in a lab to handle a noise coupling problem.
- I recall that the manufacturer recmmended alternating layers of two different
- mu-metal alloys, which they referred to as "netic" and "co-netic". One had
- high permeability and low saturation resistance and the other had the
- opposite properties (I think I have that right!). For low gauss fields
- just one layer was needed, but for high gauss fields the layering worked
- very well.
- -----------------------------------------------------------------
- Michael Joseph Edelman Wayne State University
- medelma@cms.cc.wayne.edu Computing & Information Technology
- mje@pookie.pass.wayne.edu Detroit, Michigan
- medelma@waynest1.bitnet (313) 577-0742
-
-