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OCR: TEST TEST FEATURES VSS[ 64 bits EEPROM flex of OTP xibility data factory data configuration programmed and lo cked VDD Data Customer output ir specific Manchester configuration mode of stored data TEST[ Control EEPROM arrier frequency 100 300 kH z Coct Logio TEST On-chip resonance capacitor external charge storage capacitor required Prescaler On- ch ip full wave rectifier Power-on On- chip data mo dulator Reset -uo chip high voltage prote ction / re gulation Clock RF frequency clock extractor/ prescaler Extractor ow On-chip power dissipation VDD VSS Full Wave Rectifier Modulator High Voltage Protection Resmano Capaa tor COIL1 COIL n WWW. sames co.za Cloc freque sonance rage rectifie extr actor qulation Capaci