Crystal Structure Determination Package
SHELXTL is a complete, proprietary suite of programs for the determination of crystal structures from X-ray or neutron data. It includes space group determination, direct methods, Patterson search, rotation/translation search, full matrix least squares refinement, interactive color graphics for structure solution, and output of final plots (including thermal ellipsoids) for publication, 3-D color graphics, preparation of manuscripts and tables for publication, poster preparation, and powder pattern generation. Calculations are valid for all space groups, in all orientations, and there is no effective limit on the number of reflections per structure.
Susan Byram
Product Manager
Siemens Industrial Automation, Analyt. Instruments
6300 Enterprise Lane
Madison, WI 53719-1173
USA
608-276-3041
608-276-3006 (fax)
For applications in related solution areas, see the following indices: Analytical Chemistry, Computer-Aided Molecular Design, Crystallography, Diffraction Analysis, Organic Synthesis Design, Real-Time Graphics Display, Scientific Visualization, the developer index for Siemens Industrial Automation, Analyt. Instruments and the market segment index for Chemistry, Biochem, Biotech, Materials.
SHELXTL is a Trademark of Siemens Industrial Automation
