SAINT integrates raw data frames or images from Siemens two-dimensional detectors (HI-STAR, SMART CDD, X1000, X100) used to collect single crystal X-ray diffraction data extremely rapidly. It provides exceptionally accurate 3-D integrated intensities of each reflection by using Modified Kabsch profiling and absorption and time decay corrections. Output is provided in SHELXTL
format for use in small molecule structure determination, and in biological macromolecule least-squares refinement.
Susan Byram
Product Manager
Siemens Industrial Automation, Analyt. Instruments
6300 Enterprise Lane
Madison, WI 53719-1173
USA
608-276-3041
608-276-3006 (fax)
For applications in related solution areas, see the following indices: Analytical Chemistry, Computational Chemistry, Crystallography, Image Processing, Molecular Biology, the developer index for Siemens Industrial Automation, Analyt. Instruments and the market segment index for Chemistry, Biochem, Biotech, Materials.
