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Session:

5C - Philosophy of Measurements 

Date & Time:

Tuesday August 8, 2:30 PM - 4:00 PM

Paper Title:

Evolution of Philosophy and Description of Measurement (Preliminary Rationale for VIM3) 

 

 

Speaker:

Charles Ehrlich, Physicist  

CoAuthors:

Charles Ehrlich, Wolfgang Woeger, Rene Dybkaer 

Speaker Info

Company:

NIST

Address:

MS 2600
Gaithersburg, MD, 20899-2600, United States

Phone:

301-975-4834

Email:

chuck@nist.gov 

 

 

Abstract:

Different approaches to the philosophy and description of measurement have evolved over time, and are still evolving. There is not always a clear demarcation between approaches, but rather a blending of concepts and terminologies from one approach to another. This sometimes causes confusion when trying to ascertain the objective of measurement in the different approaches, since the same term may be used to describe different concepts in the different approaches. Important examples include the concepts and terms "value," "true value," "error," "probability" and "uncertainty." Constructing a single vocabulary of metrology that is able to unambiguously encompass and harmonize all of the approaches is therefore difficult, if not impossible. This paper examines the evolution of common philosophies and ways of describing measurement, highlighting some of the differences and providing some of the rationale for the entries and structure of the March 2006 draft of the 3rd Edition of the International Vocabulary of Metrology, Basic and General Concepts and Associated Terms, or VIM3. Key Words: vocabulary, measurement, metrology DISCLAIMER: Material discussed during this presentation does not represent the current policy of the National Institute of Standards and Technology.  

 

 

 

 

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