Conference Program
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Monday August 7
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1A - Uncertainty Analysis I (Practical)
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10:45 AM - 12:15 PM
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Specifications, Measurement Uncertainty and OOT Impact Analysis; a Practical Approach
James Jenkins
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Measurement Risk Analysis Methods as Applied to Guard Bands Dennis Jackson
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Uncertainty Evaluation: Practical aspects Mariana Buzduga
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1B - Temperature I
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10:45 AM - 12:15 PM
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Study of the influence of inducing nucleation on the performance of the freezing
temperature plateau of fixed point cells Rong Ding , Mingjian Zhao, Deming Chen
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Determination of Uncertainties for Temperature Fixed Points & their ITS-90 Subranges
Douglas Scheck
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Improvement Study on the Use of Dry-Well Calibrators for PRT calibration Mingjian Zhao , Mike Hirst, Rong Ding, and Deming Chen
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1C - Equipment Management
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10:45 AM - 12:15 PM
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Implementing a Calibration Management Software Solution in a Regulated Environment -
Lessons Learned Walter Nowocin
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Computer Technology Increases Productivity, Improves Repeatability, Achieves Compliance
and Saves Money Brian Thompson , Chris Campbell
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Equipment Management: Description and Analysis of Methods to Achieve and Maintain All
Active Assets in Calibration Status Edward Snell
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1D - Metrology sans frontieres
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10:45 AM - 12:15 PM
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Enhancing Trade Facilitation and Market Access through International MAS-Q Recognition
Edward Nemeroff
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Calibration Systems Integrity at Overseas Contract Manufacturer Facilities Paul Keep
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Metrology sans Frontières: Measurements in the Global Village
Seton Bennett
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1E - Key, Regional and Interlaboratory Comparisons
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10:45 AM - 12:15 PM
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An Overview of Key and Supplementary Comparisons of DC Resistance Involving NIST
Dean Jarrett
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An Overview of Josephson Voltage Standard Interlaboratory Comparison Yi-hua Tang
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Management of the AC-DC voltage transfer difference comparison in the SIM region
Sara Campos
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2A - Uncertainty Analysis II (Models)
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2:30 PM - 4:00 PM
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Extension of the Mader's model For Quantifying The Economic Effect Of Measurement Errors
and its implementation Oscar Ramírez , Alonso Arroyo, Luis A. Rodríguez
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Critical Factors in Model Construction for Uncertainty Estimation. Sensitivity Analysis
and Design of Experiments. Salvador Echeverria-Villagomez , Carmen Marina Trejo-Morales
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Optimised Decision-making in conformity assessment Hakan Kallgren, Leslie R Pendrill
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2B - Resistance Metrology
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2:30 PM - 4:00 PM
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Measurement Techniques of Low Value High Current Single Range Current Shunts 15 Amps to
3000 Amps Marlin Kraft, Randolph Elmquist
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Temperature and Pressure Coefficients of Thomas 1 Ohm Resistors George Jones, George R. Jones, Randolph E. Elmquist
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Enhancing Long Scale Digital Multimeters and Multifunction Calibrators Mark Evans
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2C - Educator's Forum
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2:30 PM - 4:00 PM
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Introduction of Metrology Training in Japan Shoichiro Shin
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Training Metrologists - A South African Perspective Steve Sidney
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Overview of Central Georgia Technical College's Metrology Program Tony Abel
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2D - Traceability Workshop
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2:30 PM - 4:00 PM
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Traceability from the NCSLI Industrial Programs Committees' Perspective Charles Ehrlich, Roxanne Robinson, Peter Buzzard, Joe Cebulski, Rob Parchinski, Marlene Moore, David Walters, Tim
Osborne
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2E - Dimensional I (CMM Calibration Panel)
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2:30 PM - 4:00 PM
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CMM Calibration (panel) James Salsbury, Shawn Mason, Ed Morse
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In House Capability of a Touch Trigger Probe CMM Calibration Shawn Mason
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CMM Calibration Panel Edward Morse
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Tuesday August 8
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3A - News from 'Headquarters': CIPM and OIML
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8:30 AM - 10:00 AM
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Possible Changes to the SI - A Review of the Current Situation Andrew Wallard
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The CIPM Working Group on Metrology of Materials Seton Bennett
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Developments and Perspectives of the OIML Alan Johnston
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4A - Uncertainty Analysis III
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10:45 AM - 12:15 PM
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En Number 101 Michael Cruz
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The spread of Measurement Uncertainty by Training Seminar for Beginner Yukihisa Seshuyama, Takehiro Nakamura, Masaji Oku, Shigeaki Hatakeyama, Hideyuki Tanaka, Kensei Ehara
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Audits - why they aren't enough. Harry Spinks
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4B - Electro-Optics I
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10:45 AM - 12:15 PM
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Determination of the NIST Scale of Absolute Spectral Responsivity from 200 nm to 1800 nm
Jeanne Houston, T. Larason, S. Brown, and K. Lykke
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New working standards to disseminate NIST Radiometric and Photometric Scales
George Eppeldauer, Richard Austin and Charles Lustenberger
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Intercomparison Example Maritoni Litorja, Adriana Hornikova, Stefan D. Leigh, Joel B. Fowler
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4C - Metrology Training
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10:45 AM - 12:15 PM
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Training Needs Assessment for Metrology, What is it and do we need it? Susan Dass, Susan Dass
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What the U.S. Needs in Metrology Education and the Role NCSL International Can Play
Carroll Brickenkamp, Sharrill Dittmann; Ernest L. Garner
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Metrology Education for Engineers-II Syed Ahmad
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4D - Regional Metrology Organisation Reports
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10:45 AM - 12:15 PM
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COOMET - an overview Hans-Dieter Velfe
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Recent SADCMET activities Ernst Louis Marais, A Botha, CW Louw
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APMP Activities relating to CIPM-MRA Ichiro Fujima, Keith Jones
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4E - News From Canada: Research Initiatives at NRC
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10:45 AM - 12:15 PM
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The NRC Calculable Capacitor and its Role in the SI Barry Wood
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Applications of High-Field Asymetric Waveform Ion Mobility Spectrometry for the
Certification of Reference Materials Margaret McCooeye, Z. Mester, J. Lam
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Nanometrology at NRC: First Steps Jennifer Decker
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5A - Uncertainty Analysis IV
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2:30 PM - 4:00 PM
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Using manufacturer's specification as Type B error contribution Robert Brown
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k=3.9 ? . . . Why Not ?? Howard Zion
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The Significance on Consumer and Producer Risk for Uncorrected Product and Measurement
Biases Ricardo Nicholas
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5B - Electro-Optics II
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2:30 PM - 4:00 PM
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An Approximation Method For Finding Emissivity and Temperature of a Blackbody
Larry Paul, Klaus Jaeger
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Characterization and Calibration of an Optical Time Domain Reflectometer Calibrator
Donald Larson, Nicholas G. Paulter, Jr., Kenneth C. Blaney
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Crosscheck On Realisation of Illuminance Scale Between NML-SIRIM & KRISS
Mohd Nizam Abdullah, Mohd Nizam Abdullah, Abdul Rashid Zainal Abidin, Md Nor Md Chik, Yong-Wan Kim,
Seung-Nam Park
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5C - Philosophy of Measurements
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2:30 PM - 4:00 PM
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Evolution of Philosophy and Description of Measurement (Preliminary Rationale for VIM3)
Charles Ehrlich, Charles Ehrlich, Wolfgang Woeger, Rene Dybkaer
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To Measure or not to Measure, that is the question. A reflection on the ontology of
measurements. Salvador Echeverria-Villagomez, Carmen Marina Trejo-Morales
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Metrology's impact on Small and Medium Enterprises. A study of international practices
and a proposal for Mexico. Mahdha Flores-Campos, Carlos Benito Valgañon-Argueta, Salvador
Echeverría-Villagómez, Ma. Elena Lugo-Pérez
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5D - EUROMET and iMERA
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2:30 PM - 4:00 PM
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Future Developments in EUROMET Michael Kuehne
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Metrology knowledge transfer in the European metrology reseach programme Hakan Kallgren, Leslie Pendrill, Glenis Tellett and Andy Henson
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The impact of metrology research and development on society Gert Rietveld, Nick Fletcher and Ed de Leer
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5E - Measurement Quality Division of ASQ
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2:30 PM - 4:00 PM
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Metrology Job Description Initiative - Survey Results, Derived Descriptions and Formal
Submittal Christopher Grachanen
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Calibration Interval Analysis System in SQL Miguel Decos
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Educating the Customer About Calibration Graeme Payne
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Wednesday August 9
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6A - Reports from NMIs
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8:30 AM - 10:00 AM
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New trends in metrology at the Slovak Metrology Institute Matej Bily, Matej Bily, Stanislav Duris, Stanislav Musil
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News from the North: Highlights of Recent Research Initiatives at NRC Alan Steele
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The impact of measurements on Quality of Life Martyn Sené
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7A - Panel: ANSI/NCSL Z540.3
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10:45 AM - 12:15 PM
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"Calibration Requirements for M&TE" - The revision of ANSI/NCSL Z540-1
Jesse Morse, Del Caldwell, Brian Lee, Paul Nelson,Bob Fritzsche, and Doug Faison
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7B - RF/Microwave Calibrations
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10:45 AM - 12:15 PM
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The Verification and Calibration of an RF and Microwave Calibration Source Paul Roberts
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RF/Microwave Coaxial Connector Care Curtis Moss , Greg Miller (gregory.m.miller@navy.mil)
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An Interlaboratory Comparison of vector Network Analyzer Measurements Li Pi Su, George Walden and Van Black
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7C - Software and Automation
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10:45 AM - 12:15 PM
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The Air Force's "Next Gen" Automation Calibration System Marc Monnin
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The Changing Face of Instrumentation Paul Packebush, Gordon Murray
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Calibration DATA management system conforming to ISO17025 Masaru Sanoh, Masashi Kurokawa, Akiu Yamazaki
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7D - Developments in National Measurement Systems
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10:45 AM - 12:15 PM
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Review of the national measurement system in Japan Hidetoshi Nakano
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Balancing projects supporting sustainability issues with economically driven proposals
within the United Kingdom National Measurement System Helen Amos, Robert Gunn and Barry Jones
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Criteria and Process for Long Term Strategic Planning of the Metrological System in México - The case of Physical Metrology
Salvador Echeverria-Villagomez, Guillermo Silva, Carlos Matamoros, Arquimedes Ruiz, Benito Valganon
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7E - Temperature II
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10:45 AM - 12:15 PM
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Platinum Resistance Thermometer Specifications Ron Ainsworth
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Proficiency Testing for Achieving Accreditation in Thermometry Gregory Strouse
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The Future of the Kelvin and the International Temperature Scale: Hot Topics for the
National Metrology Institutes Alan Steele, A.G. Steele, K.D. Hill
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8A - Calibration System Oversight
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2:30 PM - 4:00 PM
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DCMA's Government Contract Quality Assurance Program Robert Field
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Implications of the FDA's Quality System Inspection Technique on Calibration Management
Marcus McNeely, James Erickson
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US Air Force Metrology and Calibration System Maurice Hubbard
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8B - Humidity
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2:30 PM - 4:00 PM
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An Intercomparison of First Principles Relative Humidity Reference Standards
Thomas Wiandt
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Temperature and Relative Humidity Calibration System Rick Walker, Alan Cordner
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An Intercomparison of a Two-Pressure/Two-Temperature Frost Point Generator and Chilled
Mirror Condensation Hygrometer Ken Soleyn
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8C - Calibration Laboratory Management
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2:30 PM - 4:00 PM
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Measurement Excellents, The Road to Success Steven Stahley
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Calibration Lab Performance Measurements - What's in your Metrics? Harry Spinks
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Simplified Calibration Interval Analysis Allen Bare
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8D - Legal Metrology around the World
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2:30 PM - 4:00 PM
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Weights and Measures in the United States Carol Hockert
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Trade Legal Metrology in Canada René Magnan
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Legal Metrology in Europe: Harmonising requirements through directives and the
cooperation of authorities through WELMEC. Knut Lindløv
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8E - Power Quality Standards
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2:30 PM - 4:00 PM
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Improved AC-DC current transfer standards from 10 mA to 100 A Torsten Funck, Manfred Klonz, Luciana Scarioni, Ernst Keßler
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Traceable Calibration of Power Quality Standards Waldemar Guilherme Kuerten Ihlenfeld
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Linking primary power standards and programmable Josephson arrays Luis Palafox, Luis Palafox, Günther Ramm, Ralf Behr, Waldemar G. Kürten Ihlenfeld, and Harald Moser
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Thursday August 10
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9A - Quality Standards and Systems
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8:30 AM - 10:00 AM
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Too Many Quality Standards, Too Little Quality - Is it Too Late to Change our Direction
Buddy Stricker
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Metrological Confirmation Process - ISO 10012:2003 - Key to TQM Subburaj Ramasamy
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Organizational Transformation through Implementation of a Quality System in a Metrology
Laboratory Mark Antonison, Terry Boldin, Alisha Youngblood, PhD.
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9B - DC and Capacitance Metrology
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8:30 AM - 10:00 AM
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INL Standards and Calibration Laboratories (S&CL) - Our Road to the Josephson
Junction. Mike Stears
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Calibration of an Electrometer from 100 fA to 500 fA Miles Owen
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JCSS Calibration System for Capacitance Standard in Japan Electric Meters Inspection
Corporation Akihiko Shimoyama, Seiichi Sakagami
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9C - Low Flow/Leak/Aerosol Measurements
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8:30 AM - 10:00 AM
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Anomalous Behavior of Teflon®-based Helium Permeation Flow
Standards Patrick Abbott, Justin H. Chow
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Interlaboratory comparison of low gas flow in the range 10-13 to 10-11 mol/s (10-9 to
10-7 cm3/s) using helium permeation leak artifacts. Dana Defibaugh, Dana R. Defibaugh and Patrick J. Abbott
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An Aerosol Concentration Primary Standard Miles Owen
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9D - Uncertainties Session International
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8:30 AM - 10:00 AM
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Modern Approaches to the Evaluation of Measurement Uncertainty - Evolution from Error
Analysis to Bayesian Uncertainty Klaus-Dieter Sommer, Bernd R.L. Siebert, Raghu Kacker
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Uncertainty Associated with Virtual Measurements from Computational Quantum Chemistry
Models Raghu Kacker, Karl K. Irikura, Russell D. Johnson III
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EVALUATION OF UNCERTAINTIES Jean-Claude Krynicki, Christophe Perruchet
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9E - US Measurement System Project
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8:30 AM - 10:00 AM
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NIST Assessment of the US Measurement System Dennis Swyt
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10A - Laboratory Accreditation
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10:45 AM - 12:15 PM
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ISO/IEC 17011:2004 - Its relation to ISO/IEC 17025:2005 and why laboratories should
know it Keith Greenaway
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Laboratory Accreditation and the APLAC MRA Llewellyn Richards, P Unger, R Robinson, C P Ramani
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Laboratory Accreditation--Impact on Society John Wehrmeyer
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10B - AC Metrology
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10:45 AM - 12:15 PM
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Special Inductive Voltage Divider with High Input Impedance at Ultrawide-Band Frequency
Shintaro Tsutsumi, Akira Igarashi , Shintaro Tsutsumi
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Verifying the Wideband Input of an AC Measurement Standard David Deaver, Neil Faulkner, David Deaver
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Improvements in the NIST Calibration Service for Thermal Converters and Thermal
Transfer Standards Thomas Lipe, Joseph R. Kinard, June E. Sims
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10C - Mass
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10:45 AM - 12:15 PM
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Optimization of Performance Parameters for High Precision Automated Mass Comparators
Shih Mean Lee, Shih Mean Lee, Lee Kwee LIM
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Comparison of results of the volume determination of mass standards by weighings in air
and conventional hydrostatic weighing method Jorge Nava-Martinez, Luis M. Peña-Perez
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10D - Experience of the CIPM MRA
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10:45 AM - 12:15 PM
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An NMI "User's" View of Practical Experience of the CIPM MRA Fiona Redgrave
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Participation In The CIPM-MRA Of An NMI From An "Emerging EUROMET Country"
Ionel Urdea Marcus, Fanel Iacobescu
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The Road to ISO 17025 Accreditation: Further Adventures at a National Metrology
Institute Douglas Gee
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10E - NIST Measurement Capabilities
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10:45 AM - 12:15 PM
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The NIST Time Measurement and Analysis Service Michael Lombardi, Andrew N. Novick
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Automating and Upgrading the 27.1 kN Dead Weight Machine at the National Institute of
Standards and Technology Kevin Chesnutwood, Samuel Ho
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Calibration of Vacuum Gauges in the Range 13 Pa to 133 kPa (0.1 torr to 1000 torr)
using Resonant Silicon Gauges as Transfer Standards Jay Hendricks, Patrick Abbott
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11A - Update on Revision of the VIM
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1:45 PM - 3:15 PM
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Update on Revision of the VIM Charles Ehrlich
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11B - Update on Supplements to the GUM
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1:45 PM - 3:15 PM
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JCGM/WG 1, the GUM and all that: A 2006 report on the state of affairs Wolfgang Woeger
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11C - Update on Z540.3
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1:45 PM - 3:15 PM
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Presenting Z540.3 "Requirements for Calibration of Measurement and Test
Equipment" Jesse Morse, Del Caldwell, CCG
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Tuesday August 8
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12P - Poster Session
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10:00 AM - 10:45 AM
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High Precise Thermo-anemometer Andrzej Rachalski
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Inter-Comparability Tests of Gas Flow Measurement Standards Jiunn-Haur Shaw, Jiunn-Haur Shaw, Wen-Ti LIN, Jian Wu , Chye Tiong Woon
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A Model for the Dissemination of Measurement Traceability for Air Pollution Monitoring
in Southern Africa Angelique Botha
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Wednesday August 9
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13P - Poster Session
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10:00 AM - 10:45 AM
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New system for realising the sine approximation method in ISO 16063-11 Torben Licht, Sven Erik Salboel
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Setting up of acoustic standards and calibration facility at SCL Aaron Yan, W.K. Sin
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Calibrating Linear Distances For Brinell, Vickers and Knoop hardness testing systems
using Image Analysis Systems Robert Ellis
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From 2004
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Maximizing Your Test Equipment Investment: An Inventory Modeling Approach Brent Griffith
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From 2005
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Is your Out-Of-Tolerance Investigation, Out-Of-Tolerance? Brent Griffith
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