Chris started his Metrology career in 1979 as a USAF PMEL technician - Chris presently is Hewlett-Packard's (formerly Compaq Computer) manager of Houston Metrology group. Prior to HP (Compaq) Chris was a principal engineer supporting IC manufacturing for DEC, an electronic engineer supporting NASA calibration laboratories, and a field engineer supporting U.S. Navy calibration laboratories. Chris spearheaded the development of ASQ's Certified Calibration Technician (CCT) program, is an editorial advisor for Cal Lab Magazine, is an officer of ASQ's Measurement Quality Division (MQD), is on the board of advisors for the National Association for Proficiency Testing (NAPT), is the author of three freeware metrology packages in use throughout the world, and is a co-author of ASQ's Metrology Handbook (Spring 2004 release). Chris's work-related interests include: Metrology Education, Uncertainty Analysis, Automation, and Proficiency Testing. Chris holds a B.S. in Technology and Management from the Univ. of Maryland, a B.S. in Electronics Engineering from the Cooks Institute of Electronics Engineering, and an MBA from Regis University. Chris has been awarded the following: Dr. Allan V. Astin Award (best conference paper) by NCSL International (1998), Max J. Unis Award by ASQ Measurement Quality Division (2002), Excellence Award by ASQ Certification Board (2003), and Test Engineer of the Year by Test & Measurement World magazine (2004).
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