Charles Ehrlich, Physicist 

 

Ph.D. in Physics, University of Pennsylvania, 1973; Worked in semiconductor industry for five years; Have been at NIST for 21 years; was Group Leader of NIST Pressure Group for eight years; presently Group Leader of International Legal Metrology Group; serve as U.S. Representative to International Organization of Legal Metrology (OIML); Member of Joint Committee on Guides in Metrology (JCGM) Working Group 1 (GUM Committee) and JCGM WG2 (VIM Committee); Co-Chairman of ISO TAG4 (Metrology)