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Session Topic: 3B, Microwave Session

   

Paper Title: Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations: Theory and Computational Analysis

   

Date & Time: TUESDAY, August 6, 2002

 

8:30 - 10:00am - PARALLEL SESSIONS - SESSION 3

   

Speaker: Godfrey Kwan Agilent Technologies

Email: godfrey_kwan@agilent.com

   

In this paper we present the results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. We give a brief review of the theory of one-port characterized device calibration. One-port characterized devices such as coaxial opens, shorts and loads are attractive because of their ease of handling and their ruggedness as compared to more fragile devices like sliding loads. The scattering parameter error box representation and widely used error terms in one-port VNA configurations such as directivity, source match and tracking are adopted in this paper. Based on these parameters, we examine the quality of a class of one-port VNA calibrations achievable through the use of characterized devices and the effects of different kinds of errors in device characterization can have on VNA calibrations. Experimental results involving characterization of precision slotless 2.4 mm devices using an Agilent 8510C VNA are also presented.

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