Keyword Search
 

 

Home

Search Proceedings

About NCSL

Contact Us

Help

View Paper

Session Topic: 4C, AC Metrology

   

Paper Title: Pressure Coefficients of Air Dielectric Capacitors

   

Date & Time: TUESDAY, August 6, 2002

 

10:45am - 12:15pm PARALLEL SESSIONS - SESSION 4

   

Speaker: Patricia A. Thomas Sandia National Laboratories

Email: pathoma@sandia.gov

   

Normally, precision nitrogen dielectric or fused silica dielectric standard capacitors are used to transfer capacitance values from national metrology institutes such as the National Institute of Standards and Technology (NIST). Recently, NIST has adopted a measurement technique for extrapolating 1 kHz values of capacitance to 10 MHz. The technique employs the use of a specific design of air dielectric capacitance standard that is subject to differences in value depending on the air pressure. This paper describes a series of measurements used to determine and correct for pressure differences of these air dielectric capacitors. The uncorrected values are observed to be in error by approximately 150 ppm for an elevation difference of about 1500 m between NIST and Sandia National Laboratories. This paper will address the pressure correction, how the user can correct for differences and how uncertainties are obtained. A more accurate transfer of capacitance results from the application of the correction.

NCSL International © 1996-2002 All Content.
1800 30th Street, Suite 305, Boulder, Colorado 80301-1026
Tel: (303) 440-3339 Fax: (303) 440-3384
info@ncsli.org

CD-ROM produced by X-CD Business Solutions