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Measuring Data


Measuring x- and y- Values

You can measure x (two-theta) and y (intensity) values directly from a diffraction pattern, using the Info Tool.


Measuring Distances

You can measure two-theta distances on a diffraction pattern, using the Distance Tool.


Showing Peak Positions

To show the centres of all peaks, select the Plot > Overlay Peak Markers command. The current diffraction pattern will be replotted with markers indicating the centres of the diffraction peaks.


Labelling Peaks

You can also display labels (d-spacing, 2-theta, hkl) for the most intense peaks, e.g., to display the Miller Indices for the most intense peaks, select the Plot > Show hkl command. The diffraction pattern will be replotted with the appropriate labels displayed above the most intense peaks.

The Plot > Label Peak threshold sub-menu lets you specify which peaks will be "indexed", in terms of their relative intensity; for instance, a 0% value means that all peaks will be indexed; a 50% value means that all peaks whose peak heights are greater than 50% of the current y-maximum will be indexed, and so on.)

Please be aware that displaying peak labelsas rotated text can slow down the diffraction pattern display. You are therefore advised to label only the most intense peaks, wherever possible. (To get information about individual peaks, use the Info Tool.)


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